A Comparison of U.S. and Chinese Geometry Standards through the Lens of van Hiele Levels. International Journal of Education in Mathematics, Science and Technology, [S. l.], v. 10, n. 1, p. 38–56, 2021. DOI: 10.46328/ijemst.1848. Disponível em: https://ijemst.com/index.php/ijemst/article/view/510. Acesso em: 29 jun. 2025.